Title of article
Control of metal nanostructure morphology by means of applied Si potential
Author/Authors
Ken-ichi Hara، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1999
Pages
4
From page
476
To page
479
Abstract
A fabrication technique of metal nanowires on silicon surface by using a wet process has been developed. By controlling
silicon potential in a Cu ion-containing sulfuric acid solution, morphology of deposits can be controlled. When silicon
potential against Pt counter electrode at y0.70 eV vs. SHE was applied, Cu nuclei were formed on the intersections of steps
and grew into a continuous Cu wire as a result of connection of the isolated nuclei. The width of the wire was 50 nm by
atomic force microscopy observation. The continuous wires are observed only in a narrow window of applied voltage around
y0.70 eV. At the other condition of applied potential, the deposits were either isolated or hardly visible. q1999 Elsevier
Science B.V. All rights reserved.
Keywords
Wet process , AFM , copper , H-terminated Si 111.surface , Electrochemistry
Journal title
Applied Surface Science
Serial Year
1999
Journal title
Applied Surface Science
Record number
995513
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