Title of article
The dynamics of quantum dot formation in the InAs on GaAs 001/system: growth rate effects
Author/Authors
D.I. Westwood، نويسنده , , Z. Sobiesierski، نويسنده , , C.C. Matthai، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1999
Pages
4
From page
484
To page
487
Abstract
Reflectance anisotropy spectroscopy RAS.has been used to monitor the formation and development of InAs islands
grown onto GaAs 001.substrates in real time. This is possible because the signal at a photon energy of 4.0 eV is mainly
sensitive to the thickness of the continuous inter-island wetting layer in the thickness range of interest. This makes it
possible, for the first time, to follow the partition of material between the wetting layer and islands. Monitoring the
deposition of 2 monolayers of material at a fixed growth temperature of 4758C reveals important details of the growth
process, such as the fact that the fraction of the incident flux incorporated immediately into the islands is largely insensitive
to growth rate. q1999 Elsevier Science B.V. All rights reserved.
Keywords
Reflectance anisotropy spectroscopy RAS. , epitaxy , islands , Quantum dots , Semiconductor
Journal title
Applied Surface Science
Serial Year
1999
Journal title
Applied Surface Science
Record number
995515
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