Title of article
Surface morphology of organic thin films
Author/Authors
J. Fraxedas، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1999
Pages
4
From page
623
To page
626
Abstract
Highly oriented thin films of tetrathiafulvalene tetracyanoquinodimethane TTF-TCNQ.and of p-nitrophenyl nitronyl
nitroxide p-NPNN.have been grown on alkali halide substrates by vapor deposition techniques. Their surfaces reveal
clearly differentiated morphologies, as measured with tapping mode atomic force microscopy TMAFM., exhibiting
different kinds of defects. However, the films order in similar layered molecular structures parallel to the substrate plane.
q1999 Elsevier Science B.V. All rights reserved.
Keywords
Surface structure , roughness and topography , Surface defects , morphology , atomic force microscopy
Journal title
Applied Surface Science
Serial Year
1999
Journal title
Applied Surface Science
Record number
995543
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