Title of article
Cold emission characterization using secondary electron emission spectroscopy
Author/Authors
J.E. Yater )، نويسنده , , A. Shih، نويسنده , , Suzanne R. Abrams، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1999
Pages
6
From page
341
To page
346
Abstract
Secondary electron emission spectroscopy is used to study the electron transport and emission properties of wide bandgap
materials e.g., diamond, BeO.. The secondary electron distribution generated in diamond is found to be dominated by a
high concentration of very low-energy electrons, and the emission characteristics of these low-energy electrons is used to
deduce information about the cold emission properties of the material. In particular, analysis of the extremely high yields
measured from diamond samples indicates that the low-energy electrons have long escape depths in the material.
Furthermore, electron energy distribution measurements provide insight into the emission process at various surfaces. The
electron transport and emission model inferred from the diamond measurements suggests that diamond and other wide
bandgap materials may be promising cold emitter materials, in which case secondary electron emission spectroscopy can be
a useful characterization tool. q1999 Elsevier Science B.V. All rights reserved.
Keywords
Secondary-electron-emission spectroscopy , Cold emission , Negative electron affinity NEA. , BeO , Diamond , wide bandgap
Journal title
Applied Surface Science
Serial Year
1999
Journal title
Applied Surface Science
Record number
995619
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