Title of article
Brightness measurements of a ZrOrW Schottky electron emitter in a transmission electron microscope
Author/Authors
M.J. Fransen، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1999
Pages
6
From page
357
To page
362
Abstract
We determined the reduced brightness of a ZrOrW Schottky electron emitter, with an apex radius of curvature of 0.9
mm, for extraction voltages ranging from 2.75 kV to 4 kV. The reduced brightness was found by measuring the diameter of
a small focused probe in the specimen plane of a Transmission Electron Microscope, together with the current in the probe
and the half opening angle. We find that the experimental brightness values, once corrected for lens aberrations and electron
diffraction effects, approach the theoretical maximum axial brightness well. No effects of electron–electron interactions
trajectory displacement.were observed for the range of extraction voltages we studied. The highest corrected reduced
brightness value we determined was 1.2=108 Arm2 sr V, at an extraction voltage of 4 kV. q1999 Elsevier Science B.V.
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Keywords
Electron emitters , Thermionic emission , Field emission , Brightness , Electron microscopes
Journal title
Applied Surface Science
Serial Year
1999
Journal title
Applied Surface Science
Record number
995621
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