X-ray photoelectron spectroscopy of zinc phosphide thin film

X-ray photoelectron spectroscopy XPS.has been used to study core level spectra of electron beam evaporated zinc phosphide Zn3P2.thin films. The chemical shifts of XPS core lines Zn 2P3r2 and P 2p.and Auger parameter for zinc bZns2013.9 eV.have been calculated. The results have been used to determine the bond ionicity ;20%.and composition Zn0.55P0.45.of the zinc phosphide films. An approximate value for the surface Madelung Constant aSs 1.51–1.57. has been obtained for tetragonal zinc phosphide structure. The effect of relaxation on the chemical shift has been found to be relatively small. q1999 Elsevier Science B.V. All rights reserved