Title of article
The structure of TiO thin film studied by Raman spectroscopy x and XRD
Author/Authors
Wei-Xing Xu، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1999
Pages
10
From page
253
To page
262
Abstract
The structure of TiO thin films have been studied by Raman spectroscopy. The spectra show that in the film plane, the x
atoms are connected in a way similar to that of bulk anatase. Due to the dimensional limitation, the stretching modes normal
to the film plane, A1gqB1g n3qn2., are suppressed. The dependence of this suppression on the calcination temperature
and film thickness has also been investigated. q1999 Published by Elsevier Science B.V. All rights reserved
Keywords
TiOx thin films , XRD , Raman spectroscopy
Journal title
Applied Surface Science
Serial Year
1999
Journal title
Applied Surface Science
Record number
995695
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