Title of article
Measurements on cracktips in stainless steel AISI 321 by using a new positron microprobe
Author/Authors
M. Haaks، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1999
Pages
4
From page
207
To page
210
Abstract
High resolution positron microscopy provides a new method for non-destructive investigations of plastic deformation
with spatial resolution in the micron range. As positron annihilation is highly sensitive to lattice defects, low concentrations
of dislocations are detectable, so that the plastic zone in front of a cracktip appears larger than in comparable metallographic
methods. To demonstrate this, a plastic zone in the common stainless steel AISI 321 is imaged with the Bonn Positron
Microprobe BPM.with a spatial resolution of 20 mm. q1999 Published by Elsevier Science B.V. All rights reserved.
Keywords
microbeam , Defect analysis , Positron
Journal title
Applied Surface Science
Serial Year
1999
Journal title
Applied Surface Science
Record number
995736
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