Binding energies of elements at the interface between oxygen-ion-irradiated ZrO –Y O films and an iron substrate

Binding energies of elements at the interface of oxygen-ion-irradiated ZrO2–Y2O3 films on an iron substrate were investigated by using X-ray photoelectron spectroscopy XPS.combined with ion etching. In addition to Zr or Fe simple binary suboxides, it is found that some Zr–O–Fe-like bonding configuration is formed due to ion irradiation, which has a favorable effect on the adhesion of the film to the substrate. q1999 Elsevier Science B.V. All rights reserved.