• Title of article

    Analysis of the electronic structure of hydrogenated amorphous carbon via Auger spectroscopy

  • Author/Authors

    J.C. Lascovich، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 1999
  • Pages
    9
  • From page
    10
  • To page
    18
  • Abstract
    The X-ray excited Auger electron spectroscopy XAES.has been used to investigate the pp electronic structure of hydrogenated amorphous carbon a-C:H.films, at different hydrogen content. The X-ray Photoelectron Spectra XPS.of the C1s core level with the associated photoelectron energy loss spectrum PELS.have been recorded simultaneously to the XAES data. It has been proved that the double-differentiated ppUpp Auger self-fold contribution to the CKVV Auger spectrum is very sensitive to the hydrogen content andror sample preparation conditions, providing a reliable fingerprint of the material. The extent of the electronic gap and the fraction of sp2 sites of the a-C:H films have been estimated. The features of the Auger ppUpp self-fold structure can be associated to those appearing in the electronic density of states evaluated using Molecular Dynamics simulations. q1999 Elsevier Science B.V. All rights reserved
  • Keywords
    Hydrogenated amorphous carbon , Auger spectroscopy
  • Journal title
    Applied Surface Science
  • Serial Year
    1999
  • Journal title
    Applied Surface Science
  • Record number

    995821