The dependence of the structural properties on the period numbers and the CdTe thicknesses in HgTerCdTe superlattices

Double-crystal X-ray rocking curve DCRC.measurements were performed on HgTerCdTe superlattices grown by molecular beam epitaxy MBE.in order to investigate the dependence of the structural properties on the superlattice period number and the CdTe layer thickness. The results of the DCRC measurements showed that the full width at half maximum FWHM.value of the principal peak decreased with increasing superlattice period number. As the CdTe layer thickness approached the HgTe layer thickness, the FWHM value corresponding to the principal peak decreased, and the optical absorption decreased. As the CdTe layer thickness changed, the detectable range of the HgTerCdTe superlattice related to the value of the cut-off wavelength varied. These results indicate that HgTerCdTe superlattices with various superlattice periods and CdTe layer thicknesses hold promise for potential applications in infrared photodetectors operating in a wavelength region between 4.3 and 12.5 mm. q1999 Elsevier Science B.V. All rights reserved