Title of article
Synchrotron radiation photoelectron spectroscopy study of ITO surface
Author/Authors
J. B. Lai، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2000
Pages
4
From page
35
To page
38
Abstract
Synchrotron radiation photoelectron spectroscopy SRPES.has been applied to surface analysis of indium tin oxide
ITO.thin films. Several different components of In and Sn were observed at the clean ITO surface. By comparing the
chemical compositions of the film before and after vacuum annealing, the contents of In2O3yx and Sn3O4 were found to be
the major factors influencing the electrical conductivity and optical transparency of the film. q2000 Elsevier Science B.V.
All rights reserved.
Keywords
Surface analysis , Synchrotron radiation photoelectron spectroscopy , indium tin oxide
Journal title
Applied Surface Science
Serial Year
2000
Journal title
Applied Surface Science
Record number
996030
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