Imaging of fullerene molecules on Si 111/-7=7 surface with NC-AFM

Fullerene C60.monolayer and multilayer thin films deposited on the Si 111.-7=7 surface have been investigated by non-contact atomic force microscopy NC-AFM.. Molecular-like features on the monolayer film and individual molecules on the crystalline islands of the multilayer films have been successfully resolved. We discuss the structures of C60 thin films and the mechanisms of some observed artifacts. Furthermore, a contact potential difference CPD.between the crystalline islands and the monolayer region was clearly observed. q2000 Elsevier Science B.V. All rights reserved