Imaging reconstructed TiO surfaces with non-contact atomic 2 force microscopy

We have used non-contact atomic force microscopy NC-AFM.to study TiO2 110., identifying a row with twice the thickness of a TiO2 110.1=2 row. This can be explained by aw110xextension of the added row model of TiO2 110.1=2. In thew001xdirection, this reconstruction narrows into a 1=2 row giving strong evidence that the two structures are very closely related. For the TiO2 100. surface, we present NC-AFM data which supports the intermediate 1=3-b model previously proposed on the basis of an STM experiment. q2000 Elsevier Science B.V. All rights reserved.