Title of article
Atomic resolution imaging using the electric double layer technique: friction vs. height contrast mechanisms
Author/Authors
I.Yu. Sokolov، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2000
Pages
6
From page
302
To page
307
Abstract
Atomic resolution images of the mineral astrophyllite have been obtained using the electric double layer technique
wSokolov, I.Yu., Henderson, G.S., Wicks, F.J., Applied Physics Letters 70 1997.17x and when immersed in water. Both
friction and height images were recorded simultaneously. We find that when scanning in water, the primary contribution to
the image contrast comes from the friction force, in agreement with previously published studies. However, when scanning
in the presence of an electric double layer EDL., the image contrast is primarily the result of vertical force. These results
remain valid over a large range of load forces. q2000 Elsevier Science B.V. All rights reserved
Keywords
atomic force microscopy , Molecular force interaction , True atomic resolution
Journal title
Applied Surface Science
Serial Year
2000
Journal title
Applied Surface Science
Record number
996070
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