• Title of article

    Atomic resolution imaging using the electric double layer technique: friction vs. height contrast mechanisms

  • Author/Authors

    I.Yu. Sokolov، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2000
  • Pages
    6
  • From page
    302
  • To page
    307
  • Abstract
    Atomic resolution images of the mineral astrophyllite have been obtained using the electric double layer technique wSokolov, I.Yu., Henderson, G.S., Wicks, F.J., Applied Physics Letters 70 1997.17x and when immersed in water. Both friction and height images were recorded simultaneously. We find that when scanning in water, the primary contribution to the image contrast comes from the friction force, in agreement with previously published studies. However, when scanning in the presence of an electric double layer EDL., the image contrast is primarily the result of vertical force. These results remain valid over a large range of load forces. q2000 Elsevier Science B.V. All rights reserved
  • Keywords
    atomic force microscopy , Molecular force interaction , True atomic resolution
  • Journal title
    Applied Surface Science
  • Serial Year
    2000
  • Journal title
    Applied Surface Science
  • Record number

    996070