• Title of article

    Normal and lateral force investigation using magnetically activated force sensors

  • Author/Authors

    S.P. Jarvis، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2000
  • Pages
    6
  • From page
    314
  • To page
    319
  • Abstract
    A new design of cantilever has been fabricated in order to easily apply the resonance dynamic measurement technique to lateral interactions between an atomic force microscope tip and sample. Simultaneous images have been obtained in ultrahigh vacuum UHV.for normal and lateral interactions by activating the cantilever independently at its normal and lateral resonant frequency. The distance dependence of the normal and lateral tip–sample interactions have also been investigated. q2000 Elsevier Science B.V. All rights reserved.
  • Keywords
    force spectroscopy , Dynamic lateral force microscopy , Magnetic force control , Tip–surface interaction
  • Journal title
    Applied Surface Science
  • Serial Year
    2000
  • Journal title
    Applied Surface Science
  • Record number

    996072