• Title of article

    Self-assembled monolayers containing biphenyl derivatives as challenge for nc-AFM

  • Author/Authors

    Akihiko Nakasa، نويسنده , , Uichi Akiba، نويسنده , , Masamichi Fujihira، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2000
  • Pages
    6
  • From page
    326
  • To page
    331
  • Abstract
    Mixed self-assembled monolayers SAMs.of biphenylmethanethiol derivatives with`CH3 and`COOH terminal groups and those of 1-decanethiol and a biphenylmethanethiol derivative with a`CH3 or a`COOH terminal group were prepared on Au 111.surfaces. The resulting mixed SAMs were imaged by scanning tunneling microscopy STM.. These mixed SAMs can be used to study chemical force microscopy CFM.by noncontact atomic force microscopy nc-AFM.. Namely, the`CH3 and`COOH terminal groups of the SAMs can be recognized by different surface interactions with a surface functional group on a gold-coated AFM tip derivatized with the same thiol compound with a`CH3 or a`COOH terminal group. The present result also suggests that these SAMs can be used to study CFM using nc-AFM with simultaneous tunneling current measurement. By this method, for example, a molecular location of a biphenylmethanethiol derivative with a `COOH terminal group in an alkanethiol matrix observed by nc-AFM can be confirmed by the tunneling current measurement due to lower tunneling barrier height of the biphenylmethanethiol than that of the alkanethiol derivative. q2000 Elsevier Science B.V. All rights reserved.
  • Keywords
    Biphenylmethanethiols , Scanning tunneling microscopy , Chemical force microscopy , `CH3 and`COOH terminal groups , Self-assembled monolayers
  • Journal title
    Applied Surface Science
  • Serial Year
    2000
  • Journal title
    Applied Surface Science
  • Record number

    996074