Title of article
Using higher flexural modes in non-contact force microscopy
Author/Authors
O. Pfeiffer )، نويسنده , , C. Loppacher، نويسنده , , C. Wattinger، نويسنده , , M. Bammerlin، نويسنده , , U. Gysin، نويسنده , , M. Guggisberg، نويسنده , , S. Rast، نويسنده , , R. Bennewitz، نويسنده , , E. Meyer، نويسنده , , H.-J. Gu¨ntherodt، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2000
Pages
6
From page
337
To page
342
Abstract
The oscillation characteristics of higher flexural modes of a rectangular microfabricated silicon cantilever have been
studied in ultra-high vacuum UHV.for a free cantilever and for a typical situation in non-contact force microscopy. The
results are discussed with respect to the use of such modes in dynamic force microscopy DFM.and local dissipation
measurements. q2000 Elsevier Science B.V. All rights reserved
Keywords
Flexural modes , oscillation , Non-contact force microscopy
Journal title
Applied Surface Science
Serial Year
2000
Journal title
Applied Surface Science
Record number
996076
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