• Title of article

    A low-temperature scanning force microscope for investigating buried two-dimensional electron systems under quantum Hall conditions

  • Author/Authors

    P. Weitz، نويسنده , , E. Ahlswede )، نويسنده , , J. Weis، نويسنده , , K.v. Klitzing، نويسنده , , K. Eberl، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2000
  • Pages
    6
  • From page
    349
  • To page
    354
  • Abstract
    A low-temperature scanning force microscope sensitive to electrostatics has been constructed for investigating a two-dimensional electron system 2DES.under quantum Hall conditions. In order to cope with the highly resistive properties of the 2DES under these conditions, a low-frequency measurement technique is presented, based on the shift of the cantilever’s resonance frequency induced by a small ac current modulation within the 2DES. Since the 2DES is buried in a GaAsrAlGaAs heterostructure, a special calibration technique has to be applied, which allows to map Hall-potential profiles with clearly submicron resolution. q2000 Elsevier Science B.V. All rights reserved
  • Keywords
    Scanning probe microscopy , Kelvin probe force microscopy , Quantum Hall Effect
  • Journal title
    Applied Surface Science
  • Serial Year
    2000
  • Journal title
    Applied Surface Science
  • Record number

    996078