Title of article
A low-temperature scanning force microscope for investigating buried two-dimensional electron systems under quantum Hall conditions
Author/Authors
P. Weitz، نويسنده , , E. Ahlswede )، نويسنده , , J. Weis، نويسنده , , K.v. Klitzing، نويسنده , , K. Eberl، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2000
Pages
6
From page
349
To page
354
Abstract
A low-temperature scanning force microscope sensitive to electrostatics has been constructed for investigating a
two-dimensional electron system 2DES.under quantum Hall conditions. In order to cope with the highly resistive properties
of the 2DES under these conditions, a low-frequency measurement technique is presented, based on the shift of the
cantilever’s resonance frequency induced by a small ac current modulation within the 2DES. Since the 2DES is buried in a
GaAsrAlGaAs heterostructure, a special calibration technique has to be applied, which allows to map Hall-potential profiles
with clearly submicron resolution. q2000 Elsevier Science B.V. All rights reserved
Keywords
Scanning probe microscopy , Kelvin probe force microscopy , Quantum Hall Effect
Journal title
Applied Surface Science
Serial Year
2000
Journal title
Applied Surface Science
Record number
996078
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