• Title of article

    Surface passivation of GaAs by ultra-thin cubic GaN layer

  • Author/Authors

    Sanguan Anantathanasarn)، نويسنده , , Shin-ya Ootomo، نويسنده , , Tamotsu Hashizume a، نويسنده , , Hideki Hasegawa a، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2000
  • Pages
    6
  • From page
    456
  • To page
    461
  • Abstract
    Attempts were made to passivate the GaAs 001.surface by a pseudomorphic ultra-thin cubic GaN layer formed by a nitrogen radical N-radical.or nitrogen plasma irradiation technique. Reflection high-energy electron diffraction RHEED. pattern observations and detailed X-ray photoelectron spectroscopy XPS.analysis have shown that ultra-thin cubic GaN layer on GaAs 001.surface with desirable surface stoichiometry can be realized with the optimization of surface nitridation process parameters. The passivation effects, characterized by ultra-high vacuum photoluminescence UHV PL.analysis, revealed strong enhancement in band-edge PL intensity of GaAs after passivation as large as a factor of 10 when compared with the as-grown clean molecular beam epitaxy MBE.GaAs surface. q2000 Elsevier Science B.V. All rights reserved.
  • Keywords
    PL , XPS , GaN , GaAs , Nitrogen radicals , Surface passivation
  • Journal title
    Applied Surface Science
  • Serial Year
    2000
  • Journal title
    Applied Surface Science
  • Record number

    996210