Title of article
Surface passivation of GaAs by ultra-thin cubic GaN layer
Author/Authors
Sanguan Anantathanasarn)، نويسنده , , Shin-ya Ootomo، نويسنده , , Tamotsu Hashizume a، نويسنده , , Hideki Hasegawa a، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2000
Pages
6
From page
456
To page
461
Abstract
Attempts were made to passivate the GaAs 001.surface by a pseudomorphic ultra-thin cubic GaN layer formed by a
nitrogen radical N-radical.or nitrogen plasma irradiation technique. Reflection high-energy electron diffraction RHEED.
pattern observations and detailed X-ray photoelectron spectroscopy XPS.analysis have shown that ultra-thin cubic GaN
layer on GaAs 001.surface with desirable surface stoichiometry can be realized with the optimization of surface nitridation
process parameters. The passivation effects, characterized by ultra-high vacuum photoluminescence UHV PL.analysis,
revealed strong enhancement in band-edge PL intensity of GaAs after passivation as large as a factor of 10 when compared
with the as-grown clean molecular beam epitaxy MBE.GaAs surface. q2000 Elsevier Science B.V. All rights reserved.
Keywords
PL , XPS , GaN , GaAs , Nitrogen radicals , Surface passivation
Journal title
Applied Surface Science
Serial Year
2000
Journal title
Applied Surface Science
Record number
996210
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