Title of article
Epitaxial growth of 3C-SiC films on Si substrates by triode plasma CVD using dimethylsilane
Author/Authors
Kanji Yasui)، نويسنده , , Kunio Asada، نويسنده , , Tadashi Akahane، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2000
Pages
5
From page
556
To page
560
Abstract
The epitaxial growth of cubic-silicon carbide SiC. on Si substrates was carried out by triode plasma CVD using
dimethylsilane DMS.as source gas. The lowering of electron temperature and the reduction of the rf fluctuation of plasma
space potential in the afterglow plasma region were realized by applying negative grid bias and adding bypass condensers
between cathode and grid electrode. The substrate temperature was rapidly raised from 5008C to the growth temperatures in
the flow of hydrogen and DMS, followed by the epitaxial growth. By this growth procedure, the SiC films with good surface
morphology were grown. q2000 Elsevier Science B.V. All rights reserved.
Keywords
Wide bandgap semiconductor , SiC , epitaxy , Langmuir probe , Triode plasma
Journal title
Applied Surface Science
Serial Year
2000
Journal title
Applied Surface Science
Record number
996223
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