Title of article
Synchrotron radiation studies on the growth of TSe TsTa, Ti/ 2 thin films on Ta substrates: intercalation and de-intercalation of Na
Author/Authors
D.C. Papageorgopoulos، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2000
Pages
8
From page
347
To page
354
Abstract
In this paper, we study the formation of TSe2 TsTa, Ti.-layered compound thin films, grown on polycrystalline Ta
substrates. The experiments were performed in UHV by means of photoemission spectroscopy with synchrotron radiation
measurements. The adsorption of elemental Se on Ta substrate at RT produces a film of Se multilayers. With subsequent
heating up to 4508C, the deposited Se interacts with Ta, leading to the formation of a TaSe2 thin film. The simultaneous
co-adsorption of Se and TiCl4on clean polycrystalline Ta at 2508C produces a TiSe2film of ;5 molecular layers. The
production of TiSe2 film has been confirmed by Na intercalation and following de-intercalation of Na by exposure of the
NarTiSe2film to TiCl4. q2000 Elsevier Science B.V. All rights reserved.
Keywords
Layer compounds , Adsorption , Chlorine , SXPS , intercalation , De-intercalation , TiSe2 , TaSe2 , Alkali
Journal title
Applied Surface Science
Serial Year
2000
Journal title
Applied Surface Science
Record number
996274
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