Title of article
Effects of copper content and heat treatment on the electrical properties of Ge Te Cu thin films
Author/Authors
M. Dongol، نويسنده , , M. Abou Zied، نويسنده , , G.A. Gamal، نويسنده , , A. El-Denglawey )، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2000
Pages
10
From page
365
To page
374
Abstract
The mechanism of incorporation of copper in amorphous films of Ge15Te85yxCux 0FxF7 at.%.system and the effect
of heat treatment are studied by measuring the dc conductivity in the temperature range 150–423 K.. The results indicates
that there are two conduction mechanisms. For temperature above 330 K, conductivity exhibits activated behaviour, while in
low temperature range Ts150–300 K.conductivity exhibits non-activated behaviour. In the high temperature region,
resistance and the activation energy have been calculated. The decrease in the activation energy on addition of Cu has been
interpreted according to the Kastner model. In the low temperature region Mott’s parameters have been evaluated and they
are decreased with Cu content; the results in this region are interpreted following Mott’s model. q2000 Published by
Elsevier Science B.V.
Journal title
Applied Surface Science
Serial Year
2000
Journal title
Applied Surface Science
Record number
996276
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