MBE-growth of novel MnF –CaF superlattices on Si 111/ 2 2 and their characterization

Novel short-period MnF2–CaF2superlattices SLs.on Si 111.substrates have been grown by molecular beam epitaxy. The thickness of a MnF2 layer was 1–3 molecular layers. Reflection high-energy electron diffraction studies indicated the fluorite type of crystal structure of these layers. Fluorescent extended X-ray absorption fine structure measurements supported this observation. Atomic force microscopy measurements showed a flat surface morphology of the SLs. X-ray diffraction measurements revealed well-pronounced superstructural reflections. The width of their v-curve did not exceed 2.5 arc min, which indicated a good crystal quality of the SLs. q2000 Elsevier Science B.V. All rights reserved