A chemical and morphological study of fullerene derivatives Langmuir–Blodgett films

We present here a multi-technique investigation of C60-based Langmuir–Blodgett films. C60– CH2.2–N– CH2–CH2– O.3–CH3films were investigated with atomic force microscopy AFM., static secondary ion mass spectroscopy SSIMS. and X-ray photoelectron spectroscopy XPS.measurements. The aim was to test the ability of this fullerene-derivative to form a stable monolayer to be transferred to a solid substrate. In fact, AFM measurements revealed a clustering of molecules when a single dipping was done. The C60-derivative could be detected by SSIMS as a whole and as separated fragments of C60 and hydrophilic heads and, finally, XPS enabled to measure the film thickness and to chemically characterize the film surface. q2000 Elsevier Science B.V. All rights reserved