Title of article
One-dimensional alignment of InAs dots on strain-controlled InGaAs layers by selective-area molecular-beam epitaxy
Author/Authors
Koichi Yamaguchi، نويسنده , , Tadahiro Hiraike، نويسنده , , Kazutoshi Kawaguchi، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2000
Pages
5
From page
590
To page
594
Abstract
One-dimensional 1D. arrangement of self-organizing InAs dots was demonstrated on strained InGaAs buffer layers
grown on mesa-strip-shaped GaAs substrates by molecular-beam epitaxy MBE.. Large anisotropy of strain relaxation in the
InGaAs buffer layer was observed by double crystal X-ray diffraction DCXRD.. It was pointed out that misfit dislocations
parallel to the stripe edge produce the anisotropic strain, and, as a result, 1D arrangement of InAs dots occurs. The structure
of such dot chains depended on the arsenic pressure and the mesa structure including thickness of the buffer layer and the
top width of the mesa. In particular, by changing the width of the InGaAs top surface, the number of dot chains could be
controlled one by one. q2000 Elsevier Science B.V. All rights reserved
Keywords
InAs , Molecular-beam epitaxy MBE. , Selective growth , Strain , Misfit dislocations , InGaAs , self-organization
Journal title
Applied Surface Science
Serial Year
2000
Journal title
Applied Surface Science
Record number
996383
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