Spatial distribution of Cd in CdSerZnSe superlattices studied by X-ray diffraction

Double and triple X-ray diffractomery was used for a structural characterization of the short-period superlattices SLs. CdSerZnSe with submonolayer sheets of CdSe. The multilayer structures containing SLs were grown by molecular beam epitaxy MBE.on 001.GaAs substrates. The period of SLs was in range 30–60 A., the nominal thickness of CdSe sheets varied from 0.2 to 1.2 monolayer. The parameters of SLs have been determined. Broadening of CdSe sheets in direction normal to interface has been revealed. Full width at half maximum FWHM.of this broadening is equal to about 4.5 monolayers and does not depend on the period and content of Cd in SLs. q2000 Published by Elsevier Science B.V.