• Title of article

    Formation energy of threefold coordinated oxygen in SiO2 systems

  • Author/Authors

    Alfredo Pasquarello، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2000
  • Pages
    4
  • From page
    451
  • To page
    454
  • Abstract
    Using density functional calculations in the generalized gradient approximation, the excitation energy for the formation of a threefold coordinated oxygen atom is evaluated. The bistable E1X defect of a-quartz in the neutral charge state is used as a model system. The puckered configuration which shows a threefold coordinated oxygen center together with a doubly occupied silicon dangling bond is found to be at 2.7 eV higher energy than the Si`Si dimer configuration. q2000 Elsevier Science B.V. All rights reserved.
  • Keywords
    Oxidation , Defects , Modelling , Si–SiO2 interface
  • Journal title
    Applied Surface Science
  • Serial Year
    2000
  • Journal title
    Applied Surface Science
  • Record number

    996552