Title of article
Formation energy of threefold coordinated oxygen in SiO2 systems
Author/Authors
Alfredo Pasquarello، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2000
Pages
4
From page
451
To page
454
Abstract
Using density functional calculations in the generalized gradient approximation, the excitation energy for the formation of
a threefold coordinated oxygen atom is evaluated. The bistable E1X defect of a-quartz in the neutral charge state is used as a
model system. The puckered configuration which shows a threefold coordinated oxygen center together with a doubly
occupied silicon dangling bond is found to be at 2.7 eV higher energy than the Si`Si dimer configuration. q2000 Elsevier
Science B.V. All rights reserved.
Keywords
Oxidation , Defects , Modelling , Si–SiO2 interface
Journal title
Applied Surface Science
Serial Year
2000
Journal title
Applied Surface Science
Record number
996552
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