• Title of article

    Angle-resolved photoemission study for double Ag nano®lm structures

  • Author/Authors

    K. Takahashi، نويسنده , , A. Tanaka*، نويسنده , , H. Sasaki، نويسنده , , W. Gondo، نويسنده , , S. Suzuki، نويسنده , , S. Sato، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2001
  • Pages
    4
  • From page
    164
  • To page
    167
  • Abstract
    We have carried out an angle-resolved photoemission study for Ag/Cu/Ag/Cu(1 1 1) system in order to investigate the electronic coupling between the two quantum-well (QW) states in the double Ag nano®lm structures. It is found that the outer nano®lm thickness dependence of QW state in double Ag nano®lm structures can be explained as the electronic coupling through the thin Cu barrier layer between the QW states in the inner and outer Ag nano®lms. It is also found that the coupling strength depends on the Cu barrier thickness. From these results, we discuss the electronic coupling between the two QW states in the double Ag nano®lm structures. # 2001 Elsevier Science B.V. All rights reserved.
  • Keywords
    Angle-resolved photoemission spectroscopy , Metal±metal heterostructures , electronic coupling , Quantum-well state
  • Journal title
    Applied Surface Science
  • Serial Year
    2001
  • Journal title
    Applied Surface Science
  • Record number

    996703