Title of article
Surface electromigration of Au ultrathin ®lm on MoS2
Author/Authors
Nan-Jian Wu، نويسنده , , S. Shimizu، نويسنده , , M.T. Hermie، نويسنده , , K. Sakamoto، نويسنده , , A. Natori )، نويسنده , , H. Yasunaga، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2001
Pages
4
From page
485
To page
488
Abstract
The mass transport of Au ultrathin ®lm on a semiconductor MoS2 was investigated by atomic force microscopy (AFM) and
scanning Auger microscopy (SAM). The surface electromigration of the Au ®lm was found when a dc current was passed
through the MoS2 substrate. The Au ultrathin ®lm on MoS2 grew in a typical Volmer±Weber (V±W) growth mode, The AFM
measurements indicated that the distribution of the Au islands exhibited clearly a preferential lateral spread towards the
cathode, that is, the surface electromigration took place. The direction of the surface electromigration on MoS2 is opposite to
that of the Au electromigration on Si. # 2001 Elsevier Science B.V. All rights reserved
Keywords
Mass transport , Au , Surface electromigration , MoS2
Journal title
Applied Surface Science
Serial Year
2001
Journal title
Applied Surface Science
Record number
996770
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