Simulated nc-AFM images of Si(0 0 1) surface with nanotube tip

We predicted the non-contact atomic force microscopy (nc-AFM) images of Si(0 0 1) surface using the nanotube tip from the theoretical calculations based on the tight-binding model. The images are found to depend highly on the tip shape and orientation, and the ghost atoms are frequently observed. These abnormal images are due to the effect of the multi-atom apex, which is analogous to the STM. # 2001 Elsevier Science B.V. All rights reserved.