Title of article
The effect of annealing on the electrochromic properties of microcrystalline NiOx ®lms prepared by reactive magnetron rf sputtering
Author/Authors
S.R. Jiang*، نويسنده , , B.X. Feng، نويسنده , , P.X. Yan، نويسنده , , X.M. Cai، نويسنده , , S.Y. Lu، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2001
Pages
7
From page
125
To page
131
Abstract
The effect of annealing on the electrochromic (EC) properties of nickel oxide (NiOx, x > 1) ®lms prepared by reactive rf
sputtering is studied with electrochemical measurements, optical transmittance analysis, scanning tunneling microscope
(STM), X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS). Research results show that EC properties of
NiOx ®lms can be changed greatly by annealing. The mechanism for the change of electrochromic properties was discussed in
details. # 2001 Published by Elsevier Science B.V.
Keywords
Electrochromic properties , annealing , NiOx ®lms
Journal title
Applied Surface Science
Serial Year
2001
Journal title
Applied Surface Science
Record number
996976
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