Title of article
Structure and optical properties of ScN thin films
Author/Authors
Xuewen Bai، نويسنده , , M.E Kordesch، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2001
Pages
6
From page
499
To page
504
Abstract
More than 100 ScN films ranging from 50 to 1000 nm thickness on quartz, silicon and sapphire substrates were grown by evaporation of Sc in the beam of an atomic nitrogen source and reactive sputtering from a Sc-metal target in a pure nitrogen atmosphere. ScN is the semiconductor. The refractive index in the infrared is n=2.46±0.15 for thin film ScN and the bandgap is 2.26 eV.
Keywords
ScN , Refractive index , Bandgap
Journal title
Applied Surface Science
Serial Year
2001
Journal title
Applied Surface Science
Record number
997082
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