• Title of article

    Structure and optical properties of ScN thin films

  • Author/Authors

    Xuewen Bai، نويسنده , , M.E Kordesch، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2001
  • Pages
    6
  • From page
    499
  • To page
    504
  • Abstract
    More than 100 ScN films ranging from 50 to 1000 nm thickness on quartz, silicon and sapphire substrates were grown by evaporation of Sc in the beam of an atomic nitrogen source and reactive sputtering from a Sc-metal target in a pure nitrogen atmosphere. ScN is the semiconductor. The refractive index in the infrared is n=2.46±0.15 for thin film ScN and the bandgap is 2.26 eV.
  • Keywords
    ScN , Refractive index , Bandgap
  • Journal title
    Applied Surface Science
  • Serial Year
    2001
  • Journal title
    Applied Surface Science
  • Record number

    997082