Title of article
Mechanical properties of thin films measured by nanoindenters
Author/Authors
Hiromi Ishikawa، نويسنده , , Shuichi Fudetani، نويسنده , , Mitsuji Hirohashi، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2001
Pages
7
From page
56
To page
62
Abstract
The purpose of this study was to measure the hardness and Young’s modulus from data obtained from a nanoindenter that could perform precise nanoindents as well as high-resolution surface imaging. The value of penetration hardness was determined from the load-penetration depth curve obtained from this instrument, and the effective Young’s modulus was calculated from the slope of the unloading curve. In addition, these methods were applied to measure the mechanical properties of a silicon nitride film deposited to the stainless steel by the arc ion-plating method. The penetration hardness of the film was measured to be 38.7 GPa. However, when converted into micro-Vickers hardness, the value became 2070. The effective Young’s modulus was 191 GPa.
Keywords
Nanoindenter , Arc ion plating , Silicon nitride , Penetration hardness , Young’s modulus
Journal title
Applied Surface Science
Serial Year
2001
Journal title
Applied Surface Science
Record number
997180
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