Title of article
Visualization of 3D-SIMS measurements
Author/Authors
H. Hutter، نويسنده , , K. Nowikow، نويسنده , , K. Gammer، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2001
Pages
6
From page
161
To page
166
Abstract
Secondary ion mass spectroscopy (SIMS) provides a method to examine the 3D distribution of chemical elements in solids. We created a software program (Visualizer) for the visualization of SIMS 3D data using the visualization toolkit (VTK), a free C++ class library for 3D graphics. Furthermore, we used fusion in order to obtain one single image from several 3D images, each showing the 3D distribution of one chemical element within the sample.
Keywords
3D-SIMS , Channel plate correction , Visualization toolkit
Journal title
Applied Surface Science
Serial Year
2001
Journal title
Applied Surface Science
Record number
997224
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