Title of article
Microstructural analysis of AU/NI multilayers interfaces by SAXS and STM
Author/Authors
S. Labat، نويسنده , , C. Guichet، نويسنده , , O. Thomas، نويسنده , , B. GILLES، نويسنده , , A. Marty، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2002
Pages
6
From page
182
To page
187
Abstract
We have investigated the interface roughness in Au/Ni multilayers by scanning tunnelling microscopy (STM) and small angles X-ray scattering. The comparison of the roughness statistical parameters deduced from these two techniques is reported. A good agreement is found for the ξ values but not for the h values. A linear relationship between ξ and the grain size has been evidenced from STM images and numerical simulations.
Keywords
Multilayers , Roughness , Numerical simulations , STM , X-ray scattering
Journal title
Applied Surface Science
Serial Year
2002
Journal title
Applied Surface Science
Record number
997718
Link To Document