Title of article
Estimation of useful yield in surface analysis using single photon ionisation
Author/Authors
B.V King، نويسنده , , M.J Pellin، نويسنده , , J.F Moore، نويسنده , , I.V Veryovkin، نويسنده , , M.R Savina، نويسنده , , C.E Tripa، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2003
Pages
4
From page
244
To page
247
Abstract
Secondary ion mass spectrometry (SIMS), laser sputter neutral mass spectrometry (SNMS) and laser desorption photoionisation (LDPI) have been used to investigate the desorption of molecules from self-assembled monolayers of phenylsulphides. LDPI, using an F2 excimer laser to single photon ionise gave the lowest fragmentation. A useful yield greater than 0.5% was found for analysis of diphenyldisulphide self-assembled monolayers. It is shown that using a free electron laser to postionise will lead, in the future, to analysis of many atoms and molecules with useful yields approaching 30%.
Keywords
Laser desorption , Postionisation , SIMS , SAM , Useful yield
Journal title
Applied Surface Science
Serial Year
2003
Journal title
Applied Surface Science
Record number
998430
Link To Document