• Title of article

    Accelerated life tests of CRT oxide cathodes

  • Author/Authors

    G Gaertner، نويسنده , , D Raasch، نويسنده , , D Barratt، نويسنده , , S Jenkins، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2003
  • Pages
    6
  • From page
    72
  • To page
    77
  • Abstract
    Sufficient oxide cathode life of several years in a cathode ray tube (CRT) environment at increased load is one of the key parameters in advanced CRT development. When changes are introduced, accelerated life tests are needed in order to quantify their impact. Hence the investigation of oxide cathode life limiting effects is the basis of accelerated life predictions. Especially, three basic effects are discussed and quantified: accelerated life by increased operating temperature, accelerated life by increased continuous load, and finally life acceleration by intermittent or continuos poisoning. These mechanisms can also suitably be combined.
  • Keywords
    Thermionic emission , Oxide cathodes , Accelerated life tests , Emission poisoning , Critical dc current density
  • Journal title
    Applied Surface Science
  • Serial Year
    2003
  • Journal title
    Applied Surface Science
  • Record number

    998563