Title of article
Composition characterization of combinatorial materials by scanning X-ray fluorescence microscopy using microfocused synchrotron X-ray beam
Author/Authors
Stefan Vogt، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2004
Pages
6
From page
214
To page
219
Abstract
We describe a high-throughput scanning X-ray fluorescence (XRF) microscopy setup using a microfocused synchrotron
X-ray beam, which is optimized for in-parallel X-ray characterization of composition and crystalline structure of combinatorial
samples. We present X-ray fluorescence elemental maps of a full ternary CoxMnyGe1 x y composition-spread thin film and
discuss the quantitative analysis method used for obtaining the ternary composition.
# 2003 Elsevier B.V. All rights reserved
Keywords
CoMnGe , Composition-spread , X-RAY FLUORESCENCE , X-ray diffraction , Synchrotron radiation instrumentation
Journal title
Applied Surface Science
Serial Year
2004
Journal title
Applied Surface Science
Record number
999124
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