Title of article
Nonvolatile memory based on Ge/Si hetero-nanocrystals
Author/Authors
H.G. Yang، نويسنده , , Y. Shi*، نويسنده , , L. Pu، نويسنده , , R. Zhang، نويسنده , , B. Shen، نويسنده , , P. Han، نويسنده , , S.L. Gu، نويسنده , , Y.D. Zheng، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2004
Pages
5
From page
394
To page
398
Abstract
Time characteristics have been simulated numerically both for n- and p-channel memory based on Ge/Si hetero-nanocrystals.
Owing to the advantages of the staircase potential barrier and the higher band offset on valence band, the retention time of the
memory could achieve the increase of several orders while the programming time still hold the same order approximately,
compared with the memory based on Si nanocrystals. Therefore, the present memory device would be expected to solve the
contradiction between high-speed programming and long retention time. If so, this type of device would be a promising nonvolatile
memory for future VLSI.
# 2003 Elsevier B.V. All rights reserved
Keywords
Ge/Si , Hetero-nanocrystals , Nonvolatile memory
Journal title
Applied Surface Science
Serial Year
2004
Journal title
Applied Surface Science
Record number
999226
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