Title of article
Optimal scaling of TOF-SIMS spectrum-images prior to multivariate statistical analysis
Author/Authors
Michael R. Keenan*، نويسنده , , Paul G. Kotula، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2004
Pages
5
From page
240
To page
244
Abstract
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is capable of generating huge volumes of data. TOF-SIMS
spectrum-images, comprising complete mass spectra at each point in a spatial array, are easily acquired with modern
instrumentation. With the addition of depth profiling, spectra can be collected from up to three spatial dimensions leading
to data sets that are seemingly unlimited in size. Multivariate statistical techniques such as principal component analysis,
multivariate curve resolution and other factor analysis methods are being used to meet the challenge of turning that mountain of
data into analytically useful knowledge. These methods work by extracting the essential chemical information embedded in the
high dimensional data into a limited number of factors that describe the spectrally active pure components present in the sample.
A review of the recent literature shows that the mass spectral data are often scaled prior to multivariate analysis. Common
preprocessing steps include normalization of the pixel intensities, and auto- or variance-scaling of the mass spectra. In this paper,
we will demonstrate that these pretreatments can lead to less than satisfactory results and, in fact, can be counterproductive. By
taking the Poisson nature of the data into consideration, however, a scaling method can be devised that is optimal in a maximum
likelihood sense. Using a simple and intuitive example, we will demonstrate the superiority of the optimal scaling approach for
estimating the number of pure components, for segregating the chemical information into as few components as possible, and for
discriminating small features from noise.
# 2004 Elsevier B.V. All rights reserved
Keywords
TOF-SIMS imaging , Poisson noise , PCA , Multivariate analysis
Journal title
Applied Surface Science
Serial Year
2004
Journal title
Applied Surface Science
Record number
999597
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