Title of article
Influence of hydrocarbons on element detection in ion images by SIMS microscopy
Author/Authors
Kenichi Takayasu، نويسنده , , Motonori Okabe، نويسنده , , Masaru Sawataishi، نويسنده , , Toshiko Yoshida، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2004
Pages
4
From page
502
To page
505
Abstract
Ion microscopy on fresh frozen cryostat sections, 5–10 mm thick, is useful to determine the distribution of elements and low
molecular organic compounds in the larger areas of the tissues. Fresh frozen cryostat sections of tree frog eyeball were
examined. Secondary ion images of Na, Mg, Al, C2H3, K, Ca and C3H5 were observed by ion microscopy (IMS-6f) using O2þ as
the primary beam source at an energy of 15 keV. The primary beam current was 10 10 A, the ion image magnification was varied
from 300 to 1500 and the mass resolution was set between 300 and 3000. The areas of high intensity ion counts of the organic
compounds generally showed low ion counts of elements. After long exposure to the primary ion beam, the intensity of the
organic compound ions decreased, whereas the intensity of atomic ions of elements increased.
# 2004 Elsevier B.V. All rights reserved.
Keywords
Cryostat sections , Ion microscopy , Organic substances , Ion images , High mass resolution , elements
Journal title
Applied Surface Science
Serial Year
2004
Journal title
Applied Surface Science
Record number
999647
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