• Title of article

    Influence of hydrocarbons on element detection in ion images by SIMS microscopy

  • Author/Authors

    Kenichi Takayasu، نويسنده , , Motonori Okabe، نويسنده , , Masaru Sawataishi، نويسنده , , Toshiko Yoshida، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2004
  • Pages
    4
  • From page
    502
  • To page
    505
  • Abstract
    Ion microscopy on fresh frozen cryostat sections, 5–10 mm thick, is useful to determine the distribution of elements and low molecular organic compounds in the larger areas of the tissues. Fresh frozen cryostat sections of tree frog eyeball were examined. Secondary ion images of Na, Mg, Al, C2H3, K, Ca and C3H5 were observed by ion microscopy (IMS-6f) using O2þ as the primary beam source at an energy of 15 keV. The primary beam current was 10 10 A, the ion image magnification was varied from 300 to 1500 and the mass resolution was set between 300 and 3000. The areas of high intensity ion counts of the organic compounds generally showed low ion counts of elements. After long exposure to the primary ion beam, the intensity of the organic compound ions decreased, whereas the intensity of atomic ions of elements increased. # 2004 Elsevier B.V. All rights reserved.
  • Keywords
    Cryostat sections , Ion microscopy , Organic substances , Ion images , High mass resolution , elements
  • Journal title
    Applied Surface Science
  • Serial Year
    2004
  • Journal title
    Applied Surface Science
  • Record number

    999647