• DocumentCode
    21577
  • Title

    Multi-Level Modeling of Total Ionizing Dose in a-SiO2: First Principles to Circuits

  • Author

    Kenneth F. Galloway استاد مشاور , Daniel M. Fleetwood استاد مشاور , Ronald D. Schrimpf استاد راهنما

  • University
    Vanderbilt Univerisyt
  • Grade
    نامعلوم
  • Major
    PhD )Electrical Engineering(
  • Number of pages
    0
  • Publish Date
    2003
  • Keyword

    ab-initio , Defects , radiation , first principles , circuits , compact models

  • Note
    01
  • Language
    انگليسي