DocumentCode
23015
Title
The Radiation Response and Long Term Reliability of High-k gate dielectrics
Author
Lloyd Massengill استاد مشاور , Robert Weller استاد مشاور , Dan Fleetwood استاد راهنما
University
Vanderbilt University
Grade
نامعلوم
Major
PhD )Electrical Engineering(
Number of pages
0
Publish Date
2003
Keyword
alternative gate dielectric , High-k , Reliability , radiation
Note
01
Language
انگليسي
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