DocumentCode
23990
Title
Programmable latching probe microstructures for wafer testing applications
Author
Cornely Roy H. استاد مشاور , Carr William N. استاد راهنما
University
Van Houten Library )new Jersey Institute Of Technology(
Grade
نامعلوم
Major
Master of Science )Department of Electrical and Computer Engineering(
Number of pages
0
Publish Date
2000
Keyword
Micro Electromechanical systems )MEMS( , Programmable wafer testing array
Note
01
Language
انگليسي
Link To Document