• DocumentCode
    4951
  • Title

    Probe Modules For Wafer-Level Testing Of Gigascale Chips With Electrical And Optical I/O Interconnects

  • Author

    Gaylord Thomas K. استاد مشاور , Meindl James D. استاد راهنما , Callen William استاد مشاور

  • University
    Georgia University Of Technology
  • Grade
    دكتري
  • Major
    Doctor of Philosophy
  • Number of pages
    0
  • Publish Date
    2006
  • Keyword

    optical loopback , probe , optoelectronic testing , Optical testing , waveguide , MOEMS , compliant leads , optical interconnects , Packaging , interconnects , through-wafer interconnects , MEMS

  • Note
    01
  • Language
    انگليسي
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=17&DC=4951