An Algorithm of Absorbing Multilayer Thin-Film Systems and Media at Oblique Incidence

This paper prt:sents description of a computer-aided designer algorithm (acronym CAD) of absorbing and dielectric thin-film coatings. based on the characteri stic matrix method. The graphical output for transmi.ttance and reflectance of a multilayer absorbing and dielectric structures at various wavelengths and angle of incidence are easily obtained.Other feature in the CAD include the dispersion phenomena of the structure saving as input parameters · and results in the form of ti ks. Some examples of filter and coating calculation are presented and compared with previous studies