Use of Rietveld equation and WinPLOTR program for extraction of Crystal structure data from powder diffraction patterns

Powder Diffraction pattern of tetraethylammonium cholorotrioxochromate was successfully analyzed by mathematical equations. The method used for this research based on Rietveld method to perform full matrix least-squares refinement of unit parameters from powder diffraction patterns. The use of pattern-fitting techniques for the characterization of the microstructure is discussed through applications to nanocrystalline materials. We used direct space that need no powder pattern analysis and is based on global optimization of a structural model to improve agreement between the observed and calculated diffraction patterns. N(C2H5)4[CrO3Cl] structure was determined by Rietveld equations and Winplotr computer program. The extracted data compared with single crystal X-ray data and found good agreement between two kinds of data.