شماره ركورد كنفرانس
5328
عنوان مقاله
Structural and Optical Study of Ni-Cu thin films with the different copper percentage
پديدآورندگان
Goudarzi Goudarzi Samira Department of Physics, Malayer University, Malayer, Ira , Dalouji Vali dalouji@yahoo.com Department of Physics, Malayer University, Malayer, Iran
تعداد صفحه
2
كليدواژه
thin films , Atomic Force Microscopy (AFM) , Optical properties
سال انتشار
1400
عنوان كنفرانس
بيست و سومين كنفرانس شيمي فيزيك انجمن شيمي ايران
زبان مدرك
انگليسي
چكيده فارسي
In this paper, we report co-deposition of RF-sputtering and RF-PECVD for growth of Ni NPs @ a-C: H with different percentages of Cu. We studied optical constants of Ni-Cu thin films, with constant Ni content and different percentages of 5%, 40%, and 75 % from Cu atoms. With the increase of Cu percentage, the RMS roughness of films was decreased. All films exhibit a reflectance and transmittance of about 20% and 50%, respectively.
كشور
ايران
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