DocumentCode
1002630
Title
Class-C Harmonic CMOS VCOs, With a General Result on Phase Noise
Author
Mazzanti, Andrea ; Andreani, Pietro
Author_Institution
Dipt. di Ing. dell´´lnformazione, Univ. di Modena e Reggio Emilia, Modena
Volume
43
Issue
12
fYear
2008
Firstpage
2716
Lastpage
2729
Abstract
A harmonic oscillator topology displaying an improved phase noise performance is introduced in this paper. Exploiting the advantages yielded by operating the core transistors in class-C, a theoretical 3.9 dB phase noise improvement compared to the standard differential-pair LC-tank oscillator is achieved for the same current consumption. Further benefits derive from the natural rejection of the tail bias current noise, and from the absence of parasitic nodes sensitive to stray capacitances. Closed-form phase-noise equations obtained from a rigorous time-variant circuit analysis are presented, as well as a time-variant study of the stability of the oscillation amplitude, resulting in simple guidelines for a reliable design. Furthermore, the analysis of phase noise is extended to encompass a general harmonic oscillator, showing that all phase noise relations previously obtained for specific LC oscillator topologies are special cases of a very general and remarkably simple result.
Keywords
CMOS integrated circuits; network analysis; phase noise; voltage-controlled oscillators; class-C harmonic CMOS VCO; current consumption; differential-pair LC-tank oscillator; harmonic oscillator topology; oscillation amplitude; parasitic nodes; phase noise; phase-noise equations; rigorous time-variant circuit analysis; stray capacitances; tail bias current noise; time-variant study; Circuit analysis; Circuit noise; Circuit stability; Equations; Oscillators; Parasitic capacitance; Phase noise; Stability analysis; Tail; Topology; Amplitude stability; class-C; impulse sensitivity function; phase noise; radio frequency integrated circuits; squegging; voltage controlled oscillators;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.2008.2004867
Filename
4684621
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